New Approach for Temperature Characterization of Low Loss Dielectric Materials

Authors

  • Jamal Rammal Electronics Department, School of Technology, MUC University, Beirut, Lebanon
  • Farah Salameh Electronics Department, School of Technology, MUC University, Beirut, Lebanon
  • Hassan Mehdi Electronics Department, School of Technology, MUC University, Beirut, Lebanon

Keywords:

Split cylinder resonator, characterization, substrates, dielectric, EM monitoring, temperature

Abstract

This article presents a new technique for the characterization of low loss dielectric materials at high temperatures: the split cylinder resonator cavity. This technique allows the accurate characterization of the dimensional and electrical characteristics of the cavity and the electromagnetic properties of a dielectric material, simultaneously in one temperature cycle. To do this, the couple TE011+TE013 is used to characterize the sample and the couple TE012+TE014 is used to characterize the cavity conductivity and dimensions. Measurements of conductivity and dimensions using the couple TE012+TE014 for a loaded cavity at ambient temperature and during a thermal cycle show an agreement with the values obtained using the couple TE011+TE013 for an unloaded cavity at ambient temperature and during a thermal cycle. The characterization of an Alumina sample during a thermal cycle performed using the new technique and the traditional one shows a good agreement for the permittivities and the loss tangents.

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Author Biographies

Jamal Rammal, Electronics Department, School of Technology, MUC University, Beirut, Lebanon

Jamal Rammal received his Ph.D. in circuits, systems, and micro and nanotechnology for optical and high-frequency communications from XLIM Laboratory, Limoges, France in 2014. His research interests include
microwave characterization of dielectric materials, microwave sensors, and microwave processing.

Farah Salameh, Electronics Department, School of Technology, MUC University, Beirut, Lebanon

Farah Salameh got her MSc and her Ph.D. in electrical engineering from the National Polytechnic Institute of Toulouse (INPT), Toulouse, France, respectively in 2013 and 2016. Her main research interest is the development of statistical methods for the modeling and the validation of electrical engineering component lifespan.

Hassan Mehdi, Electronics Department, School of Technology, MUC University, Beirut, Lebanon

Hassan Mehdi received his Ph.D. in circuits, systems, and micro and nanotechnology for optical and high-frequency communications from XLIM Laboratory, Limoges, France in 2010. His research interests include system simulations.

References

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Published

2020-10-26

How to Cite

Jamal Rammal, Farah Salameh, & Hassan Mehdi. (2020). New Approach for Temperature Characterization of Low Loss Dielectric Materials. International Journal of Advances in Microwave Technology, 2(4), 136-140. Retrieved from https://www.ijamt.com/index.php/ijamt/article/view/62

Issue

Vol. 2 No. 4 (2017): Volume 2, Issue 4 (November 2017)

Section

Rasearch Paper

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